Cross-Sectional Analysis of CuInS2 Thin Film Prepared from Electroplated Precursor

• Onuma Yoshio

  Core Technology Research Laboratory, Shinko Electric Industries Co., Ltd. Faculty of Engineering, Shinshu University

• Takeuchi Kenji

  Core Technology Research Laboratory, Shinko Electric Industries Co., Ltd.

• Ichikawa Sumihiro

  Core Technology Research Laboratory, Shinko Electric Industries Co., Ltd.

• Suzuki Yasunari

  Core Technology Research Laboratory, Shinko Electric Industries Co., Ltd.

• Fukasawa Ryo

  Core Technology Research Laboratory, Shinko Electric Industries Co., Ltd.

• Matono Daisuke

  Core Technology Research Laboratory, Shinko Electric Industries Co., Ltd.

• Nakamura Kenji

  Core Technology Research Laboratory, Shinko Electric Industries Co., Ltd.

• Nakazawa Masao

  Core Technology Research Laboratory, Shinko Electric Industries Co., Ltd.

• Takei Koji

  Core Technology Research Laboratory, Shinko Electric Industries Co., Ltd.

• Hashimoto Yoshio

  Faculty of Engineering, Shinshu University

• Ito Kentaro

  Faculty of Engineering, Shinshu University

Bibliographic Information

Other Title

• Cross-Sectional Analysis of CuInS₂Thin Film Prepared from Electroplated Precursor

Abstract

Thin CuInS₂ films were prepared by sulfurization of Cu/In bi-layers. The precursor layer was firstly electroplated onto the treated surface of Mo-coated glass. The observation of the cross- section prepared by focused ion beam (FIB) etching revealed that the void-free film was initially formed on the top surface of the precursor and subsequently continued to grow until the advancing front of the film reached the Mo layer. Then followed the nucleation of voids near the bottom of the CuInS₂ film. Prolonged sulfurization caused the voids to increase in size. Thin film solar cells were fabricated using the CuInS₂ film as an optical absorber layer. It was found that the optimization of a sulfurization period is important in order to improve the cell efficiency.

Journal

• Japanese Journal of Applied Physics

  Japanese Journal of Applied Physics 43 (1A/B), L108-L110, 2004

  The Japan Society of Applied Physics

Keywords

• CuInS<SUB>2</SUB>
• thin film
• electroplating
• sulfurization
• solar cell
• focused ion beam

Details

• CRID: 1390282681242712448
• NII Article ID: 10011950445
• NII Article ID: 210000056918
• NII Article ID: 130004531726
• NII Book ID: AA11906093
• DOI: 10.1143/jjap.43.l108
• ISSN: 13474065
• ISSN: 00214922
• NDL BIB ID: 6834975
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I6834975
• Web Site: http://stacks.iop.org/1347-4065/43/i=1A/a=L108/pdf
• Text Lang: en
• Data Source:
  • JaLC
  • NDL
  • Crossref
  • CiNii Articles
• Abstract License Flag: Disallowed