Spontaneous Polarization of Neodymium-Substituted Bi<sub>4</sub>Ti<sub>3</sub>O<sub>12</sub>Estimated from Epitaxially Grown Thin Films with in-Plane<i>c</i>-Axis Orientations

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  • Watanabe Takayuki
    Department of Innovative and Engineered Materials, Interdisciplinary Graduate School of Science and Engineering, Tokyo Institute of Technology
  • Kojima Takashi
    Department of Innovative and Engineered Materials, Interdisciplinary Graduate School of Science and Engineering, Tokyo Institute of Technology
  • Uchida Hiroshi
    Department of Chemistry, Sophia University
  • Okada Isao
    Department of Chemistry, Sophia University
  • Funakubo Hiroshi
    Department of Innovative and Engineered Materials, Interdisciplinary Graduate School of Science and Engineering, Tokyo Institute of Technology

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  • Spontaneous Polarization of Neodymium-Substituted Bi4Ti3O12 Estimated from Epitaxially Grown Thin Films with in-Plane c-Axis Orientations

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(100)/(010)- and (110)-oriented neodymium-substituted Bi4Ti3O12 films were grown by metalorganic chemical vapor deposition on (101) and (001)RuO2 layers with a rutile structure. Epitaxial growth of the films with an in-plane c-axis orientation was confirmed by several X-ray diffraction measurements. Large remanent polarizations of 31 and 34 μC/cm2 were observed for the (100)/(010)- and (110)-oriented films, respectively. On the basis of the volume fractions of (100)- and (010)-oriented crystal estimated for the (100)/(010)-oriented film by X-ray diffraction, the spontaneous polarization of neodymium-substituted Bi4Ti3O12 along the a-axis was estimated to be 58 μC/cm2 from both kinds of epitaxial films.

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