Interface observation in Au/Ni/p-GaN studied by HREM and energy-filtering TEM

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著者

    • LIM Sung-Hwan
    • Department of Advanced Materials Science and Engineering, Kangwon National University
    • RA Tae-Yeub
    • Advanced Materials R&D Division, Korea Institute of Industrial Technology
    • KIM Won-Yong
    • Advanced Materials R&D Division, Korea Institute of Industrial Technology

収録刊行物

  • Journal of electron microscopy

    Journal of electron microscopy 52(5), 459-464, 2003-10-01

参考文献:  12件中 1-12件 を表示

各種コード

  • NII論文ID(NAID)
    10012549853
  • NII書誌ID(NCID)
    AA00697060
  • 本文言語コード
    ENG
  • 資料種別
    SHO
  • ISSN
    00220744
  • データ提供元
    CJP書誌 
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