Interface observation in Au/Ni/p-GaN studied by HREM and energy-filtering TEM

• LIM Sung-Hwan

  Department of Advanced Materials Science and Engineering, Kangwon National University

• RA Tae-Yeub

  Advanced Materials R&D Division, Korea Institute of Industrial Technology

• KIM Won-Yong

  Advanced Materials R&D Division, Korea Institute of Industrial Technology

Journal

• Journal of electron microscopy

  Journal of electron microscopy 52 (5), 459-464, 2003-10-01

Keywords

• ohmic contacts
• interface
• high-resolution electron microscopy
• energyfiltering imaging

Details

• CRID: 1571980075035475712
• NII Article ID: 10012549853
• NII Book ID: AA00697060
• ISSN: 00220744
• Text Lang: en
• Data Source:
  • CiNii Articles