Measurement of the Charge Cloud Shape Generated in the Fully Depleted Back-Illuminated Charge-Coupled Device

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著者

    • Miyata Emi Miyata Emi
    • Department of Earth & Space Science, Graduate School of Science, Osaka University, 1-1 Machikaneyama, Toyonaka, Osaka 560-0043, Japan
    • Miki Masami Miki Masami
    • Department of Earth & Space Science, Graduate School of Science, Osaka University, 1-1 Machikaneyama, Toyonaka, Osaka 560-0043, Japan
    • Tsunemi Hiroshi
    • Department of Earth & Space Science, Graduate School of Science, Osaka University, 1-1 Machikaneyama, Toyonaka, Osaka 560-0043, Japan
    • Miyaguchi Kazuhisa
    • Solid State Division, Hamamatsu Photonics K.K., 1126-1 Ichino-cho, Hamamatsu 435-8558, Japan

抄録

The mesh experiment enables us to specify the X-ray point of interaction with a subpixel resolution. Miyata et al. [Jpn. J. Appl. Phys. 41 (2002) 5827] measured the charge cloud shape produced in a back-illuminated (BI) charge-coupled device (CCD). They found that there are two components of the charge cloud shape: a narrow component and a broad component. The size of the narrow component is 2.8–5.7 μm in units of standard deviation and strongly depends on the attenuation length of incident X-rays in Si, suggesting that it originates in the depletion region. On the other hand, the size of the broad component is roughly constant at ${\simeq}13$ μm and does not depend on X-ray energies, suggesting that it originates in the field-free region. We applied the mesh experiment with the fully depleted BI CCD and found that there is a single component of the charge cloud with a size similar to that of the narrow component in Miyata et al.'s. We thus confirmed that the narrow and broad components originate in the depletion region and the field-free region, respectively.

収録刊行物

  • Japanese journal of applied physics. Pt. 1, Regular papers & short notes

    Japanese journal of applied physics. Pt. 1, Regular papers & short notes 42(11), 7135-7139, 2003-11-15

    公益社団法人 応用物理学会

参考文献:  7件中 1-7件 を表示

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各種コード

  • NII論文ID(NAID)
    10012564968
  • NII書誌ID(NCID)
    AA10457675
  • 本文言語コード
    EN
  • 資料種別
    ART
  • 雑誌種別
    大学紀要
  • ISSN
    0021-4922
  • NDL 記事登録ID
    6753194
  • NDL 雑誌分類
    ZM35(科学技術--物理学)
  • NDL 請求記号
    Z53-A375
  • データ提供元
    CJP書誌  NDL  J-STAGE  JSAP 
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