Comparison of Capped Carbon Nanotube with Open-Ended One for Field Emission

• Tanaka Hiroyoshi

  Department of Physics and Electronics, Osaka Prefecture University

• Akita Seiji

  Department of Physics and Electronics, Osaka Prefecture University

• Pan Lujun

  Department of Physics and Electronics, Osaka Prefecture University

• Nakayama Yoshikazu

  Department of Physics and Electronics, Osaka Prefecture University Handai Frontier Research Center, Osaka University

Abstract

Field emission properties of standalone carbon nanotubes have been investigated in terms of the capped and open-ended tip shapes. The capped multiwall nanotube with a tip curvature of ∼2.5 nm is compared with the open-ended single wall nanotube with a diameter of ∼5 nm. These samples have almost the same current-voltage characteristics but show different field-emission-microscope images. The capped one shows some bright spots and in contrast the open-ended one shows twelve bright stripes with a spindle shape. The magnification of the images is larger for the capped one than for the open-ended one.

Journal

• Japanese Journal of Applied Physics

  Japanese Journal of Applied Physics 43 (3B), L427-L429, 2004

  The Japan Society of Applied Physics

Keywords

• multiwall carbon nanotube
• open-ended carbon nanotube
• field emission
• current-voltage characteristics
• field emission microscope

Details

• CRID: 1390001206265075968
• NII Article ID: 10012705252
• NII Article ID: 210000057198
• NII Article ID: 130004531778
• NII Book ID: AA11906093
• DOI: 10.1143/jjap.43.l427
• ISSN: 13474065
• ISSN: 00214922
• NDL BIB ID: 6887574
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I6887574
• Web Site: https://iopscience.iop.org/article/10.1143/JJAP.43.L427
• Web Site: https://iopscience.iop.org/article/10.1143/JJAP.43.L427/pdf
• Text Lang: en
• Data Source:
  • JaLC
  • NDL
  • Crossref
  • CiNii Articles
• Abstract License Flag: Disallowed