Localized electron irradiation methods and their application to detection of flow-field of point defects

• ARAI Shigeo

  Center for Integrated Research in Science and Engineering, Nagoya University

• SATOH Yuhki

  Institute for Materials Research, Tohoku University

• ARAKAWA Kazuto

  Department of Material Science, Interdisciplinary Faculty of Science and Engineering Shimane University

• MORITA Chiaki

  Center for Integrated Research in Science and Engineering, Nagoya University

• KIRITANI Michio

  Department of Electronic Engineering, Hiroshima Institute of Technology

Journal

• Journal of electron microscopy

  Journal of electron microscopy 53 (1), 21-27, 2004-02-01

Keywords

• ultrahigh-voltage transmission electron microscope
• electron radiation damage
• localized irradiation
• outflow point defects
• one-dimensional motion

Details

• CRID: 1573105974925340160
• NII Article ID: 10012715875
• NII Book ID: AA00697060
• ISSN: 00220744
• Text Lang: en
• Data Source:
  • CiNii Articles