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- 橋本 哲
- 鋼管計測 (株)
書誌事項
- タイトル別名
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- Damage of Metallic Oxides Appeared in XPS Spectral Change after Ion Bombardment
- XPS スペクトル ヘンカ ニ アラワレル イオン ショウシャ ニ ヨル キンゾク サンカブツ ノ ソンショウ
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抄録
XPS or AES sputter depth profiling sometimes encounters difficulties with the materials that are damaged by ion bombardment. Therefore, it becomes difficult to determine precise chemical states of such materials. The damages of oxides by ion bombardment as observed in XPS spectra were reviewed. Spectrum changes are classified into three types; (1) additional peaks appear as a result of reduction for one type of the oxides, (2) the spectra are broadened for the second one, and (3) the third type oxides are not chemically changed. It is pointed out that these changes are related to the change of the enthalpy of atomization and ionicity. Secondly, the intensity changes as a function of sputtering time is formulated using reduction cross sections by the ion bombardment and sputtering yield.
収録刊行物
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- 表面科学
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表面科学 25 (4), 198-204, 2004
公益社団法人 日本表面科学会
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キーワード
詳細情報
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- CRID
- 1390001206458188928
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- NII論文ID
- 10012860626
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- NII書誌ID
- AN00334149
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- COI
- 1:CAS:528:DC%2BD2cXlsVWjtL4%3D
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- ISSN
- 18814743
- 03885321
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- NDL書誌ID
- 6919658
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可