アルミナおよびマルチパクタ抑止コーティングの二次電子放出係数の温度依存性 Temperature Dependence of Secondary Electron Emission on Alumina and Anti-multipactor Coatings

この論文にアクセスする

この論文をさがす

著者

抄録

Electrical breakdown (surface discharge) is one of the most serious problems for developing compact and/or higher voltage insulation in a vacuum. High secondary electron emission (SEE) yields result in the multipactor (electron multiplication on the dielectric surface). Multipactor induces not only discharging but also excess surface heating, leading to localized surface melting. Thus, SEE at high temperature is important for understanding the actual breakdown process.<BR>The SEE yield of single crystal alumina (sapphire) and anti-multipactor coatings, such as TiN and DLC films having low SEE yields, are measured with a scanning electron microscope (SEM) by pulsed-beam method. In order to examine the surface charging, multi-pulse methods are also carried out for the sapphire disk at high temperature.

収録刊行物

  • 真空 = JOURNAL OF THE VACUUM SOCIETY OF JAPAN

    真空 = JOURNAL OF THE VACUUM SOCIETY OF JAPAN 47(3), 120-123, 2004-03-20

    The Vacuum Society of Japan

参考文献:  8件中 1-8件 を表示

  • <no title>

    道園真一郎

    真空 40, 436, 1997

    被引用文献2件

  • <no title>

    WOLFF P. A.

    Phys. Rev. 95, 56, 1954

    被引用文献4件

  • <no title>

    JOHNSON J. B.

    Phys. Rev. 91, 582, 1953

    被引用文献3件

  • <no title>

    JOHNSON J. B.

    Phys. Rev. 93, 668, 1954

    被引用文献1件

  • <no title>

    LEE K. H.

    Phys. Rev. B19, 3217, 1979

    被引用文献2件

  • <no title>

    NYAIESH A. R.

    J. Vac. Sci. Tech. A4, 2356, 1986

    被引用文献1件

  • <no title>

    GRILL A.

    Diamond and related materials 8, 428-434, 1999

    被引用文献18件

  • <no title>

    CAZAUX J.

    J. Electron Sepc. and Rel. Phenomena 105, 155, 1999

    被引用文献3件

各種コード

  • NII論文ID(NAID)
    10012866964
  • NII書誌ID(NCID)
    AN00119871
  • 本文言語コード
    JPN
  • 資料種別
    SHO
  • ISSN
    05598516
  • NDL 記事登録ID
    6929297
  • NDL 雑誌分類
    ZN15(科学技術--機械工学・工業--流体機械)
  • NDL 請求記号
    Z16-474
  • データ提供元
    CJP書誌  NDL  J-STAGE 
ページトップへ