Electron holographic mapping of two-dimensional doping areas in cross-sectional device specimens prepared by the lift-out technique based on a focused ion beam

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  • CRID
    1574231874842002432
  • NII Article ID
    10012932510
  • NII Book ID
    AA00697060
  • ISSN
    00220744
  • Text Lang
    en
  • Data Source
    • CiNii Articles

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