Fabrication of planar and cross-sectional TEM specimens using a focused ion beam
収録刊行物
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- Mater. Res. Soc. Symp. Proc.
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Mater. Res. Soc. Symp. Proc. 199 205-216, 1990
Mater. Res. Soc. Symp. Proc. 199 205-216, 1990