Mass thickness determination by inelastic scattering in microanalysis of organic samples

• LEAPMAN R D

収録刊行物

• Analytical Electron Microscopy

  Analytical Electron Microscopy 83-88, 1984

  San Francisco Press

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• CRID: 1572824499958446208
• NII論文ID: 10012932575
• データソース種別:
  • CiNii Articles