Atom-selective imaging and mechanical atom manipulation using the non-contact atomic force microscope

• MORITA Seizo

  Department of Electronic Engineering

• SUGIMOTO Yoshiaki

  Department of Electronic Engineering

• OYABU Noriaki

  Department of Electronic Engineering

• NISHI Ryuji

  Department of Electronic Engineering

• CUSTANCE Oscar

  Handai Frontier Research Center

• SUGAWARA Yasuhiro

  Department of Applied Physics, Graduate School of Engineering, Osaka University

• ABE Masayuki

  Department of Electronic Engineering

収録刊行物

• Journal of electron microscopy

  Journal of electron microscopy 53 (2), 163-168, 2004-04-01

キーワード

• atom-selective imaging
• mechanical atom manipulation
• non-contact atomic force microscope
• distinction of atom species
• atom manipulation

詳細情報

• CRID: 1570854175121084288
• NII論文ID: 10012932648
• NII書誌ID: AA00697060
• ISSN: 00220744
• 本文言語コード: en
• データソース種別:
  • CiNii Articles