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- SAIKI Toshiharu
- Department of Electronics and Electrical Engineering, Keio University
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- MATSUDA Kazunari
- Kanagawa Academy of Science and Technology
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- NOMURA Shintaro
- Institute of Physics, University of Tsukuba
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- MIHARA Masaru
- Semiconductor Laboratory, Institute of Physical and Chemical Research (RIKEN)
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- AOYAGI Yoshinobu
- Interdisciplinary Graduate School of Science and Engineering, Tokyo Institute of Technology
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- NAIR Selvakumar
- Center for Advanced Nanotechnology, University of Toronto
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- TAKAGAHARA Toshihide
- Department of Electronics and Information Science, Kyoto Institute of Technology
この論文をさがす
収録刊行物
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- Journal of electron microscopy
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Journal of electron microscopy 53 (2), 193-201, 2004-04-01
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詳細情報 詳細情報について
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- CRID
- 1571417125074848256
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- NII論文ID
- 10012932769
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- NII書誌ID
- AA00697060
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- ISSN
- 00220744
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- 本文言語コード
- en
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- データソース種別
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- CiNii Articles