Plasmon-loss imaging of chains of crystalline-silicon nanospheres and silicon nanowires

• Hideo Kohno

• Seiji Takeda

• Koji Tanaka

書誌事項

タイトル別名

• Plasmon loss imaging of chains of crystalline silicon nanospheres and silicon nanowires
• Recent Development in the Electron Microscopy of Semiconductors
• Recent Development in the Electron Microscopy of Semiconductors

収録刊行物

• Journal of electron microscopy

  Journal of electron microscopy 49 (2), 275-280, 2000

  Oxford : Published for the Japanese Society of Electron Microscopy by Oxford University Press

キーワード

• chains of silicon nanospheres
• silicon nanowires
• energy-filtered TEM
• EELS
• plasmon-loss imaging
• nanostructure

詳細情報

• CRID: 1520291855504014848
• NII論文ID: 10013017169
• NII書誌ID: AA00697060
• ISSN: 00220744
• NDL書誌ID: 5363407
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I5363407
• 本文言語コード: en
• NDL 雑誌分類:
  • ZN33(科学技術--電気工学・電気機械工業--電子工学・電気通信)
• データソース種別:
  • NDL
  • CiNii Articles