Optimizing the environment for sub-0.2 nm scanning transmission electron microscopy

• David A. Muller

• John Grazul

Bibliographic Information

Other Title

• Optimizing the environment for sub 0 2 nm scanning transmission electron microscopy

Journal

• Journal of electron microscopy

  Journal of electron microscopy 50 (3), 219-226, 2001

  Oxford : Published for the Japanese Society of Electron Microscopy by Oxford University Press

Keywords

• STEM
• EELS
• magnetic fields
• pressure
• atomic resolution

Details

• CRID: 1524232504984209152
• NII Article ID: 10013017878
• NII Book ID: AA00697060
• ISSN: 00220744
• NDL BIB ID: 5834902
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I5834902
• Text Lang: en
• NDL Source Classification:
  • ZN33(科学技術--電気工学・電気機械工業--電子工学・電気通信)
• Data Source:
  • NDL
  • CiNii Articles