Materials Characterization by Advanced Specimen Preparation Methods and Analytical Electron Microscopy

• SHINDO Daisuke

  Institute of Multidisciplinary Research for Advanced Materials, Tohoku University

• TANIYAMA Akira

  Sumitomo Metal Industries, Ltd., Corporate Research & Development Laboratories

Bibliographic Information

Other Title

• 特集「先端試料作製技法と分析電子顕微鏡法による材料評価」によせて

Journal

• 日本金屬學會誌 = Journal of the Japan Institute of Metals

  日本金屬學會誌 = Journal of the Japan Institute of Metals 68 (5), 263-, 2004-05-20

Keywords

• ultramicrotomy
• focused ion beam
• electron energy-loss spectroscopy
• energy dispersive x-ray spectroscopy
• high-resolution electron microscopy
• electron holography
• elemental mapping

Details

• CRID: 1571417125028638208
• NII Article ID: 10013070433
• NII Book ID: AN00062446
• ISSN: 00214876
• Text Lang: ja
• Data Source:
  • CiNii Articles