Advantage of Thin-Film Filter for Reliable Photoemission Spectroscopy Using High-Flux Discharging Lamp

• Yokoya Takayoshi

  Institute for Solid State Physics, University of Tokyo

• Tsuda Shunsuke

  Institute for Solid State Physics, University of Tokyo

• Kiss Takayuki

  Institute for Solid State Physics, University of Tokyo

• Shin Shik

  Institute for Solid State Physics, University of Tokyo The Institute of Physical and Chemical Research (RIKEN)

• Mochiku Takashi

  National Institute for Materials Science

• Hirata Kazuto

  National Institute for Materials Science

抄録

An aluminum film with a thickness of 1500 Å has been used as a filter for the He Iα resonance line (21.2182 eV) from a microwave-driven high-flux discharging lamp to reduce the degradation of sample surfaces during photoemission spectroscopy (PES) measurements. A marked increase in the lifetime of sample surfaces, which overcomes a ∼90% intensity reduction, has been observed. The thin-film filter, if combined with a high-flux discharging lamp, provides clean vacuum ultraviolet lights for reliable PES measurements with an ultrahigh resolution.

収録刊行物

• Japanese Journal of Applied Physics

  Japanese Journal of Applied Physics 43 (6A), 3618-3619, 2004

  The Japan Society of Applied Physics

キーワード

• aluminum thin-film filter
• discharging lamp
• degradation free
• angle-resolved photoemission spectroscop

詳細情報

• CRID: 1390282681240871040
• NII論文ID: 10013155416
• NII論文ID: 210000055738
• NII論文ID: 130004532142
• NII書誌ID: AA10457675
• DOI: 10.1143/jjap.43.3618
• ISSN: 13474065
• ISSN: 00214922
• Web Site: https://iopscience.iop.org/article/10.1143/JJAP.43.3618
• Web Site: https://iopscience.iop.org/article/10.1143/JJAP.43.3618/pdf
• 本文言語コード: en
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