紫外光電子分光法（ＵＰＳ）を用いた界面の研究

• 池田 進

  東京大学大学院新領域創成科学研究科複雑理工学専攻

• 斉木 幸一朗

  東京大学大学院新領域創成科学研究科複雑理工学専攻

書誌事項

タイトル別名

• Study of interfaces using ultraviolet photoelectron spectroscopy (UPS)
• 最近の研究から 紫外光電子分光法(UPS)を用いた界面の研究
• サイキン ノ ケンキュウ カラ シガイ コウデンシ ブンコウホウ UPS オ モチイタ カイメン ノ ケンキュウ

抄録

Ultraviolet photoelectron spectroscopy (UPS) is a powerful tool to investigate the interfaces where two materials contact. The large excitation probability for valence electrons and the high surface sensitivity of UPS enable us to obtain the information of interaction between two materials at the interface. A UPS study on Al/Sn interface is introduced as an example to get insight to the origin of eutectic system formation. A valence band spectrum with two increased and two decreased regions of photoemission intensity was observed only for a very thin Al film deposited on a Sn substrate. This phenomenon suggested that valence bands of Al and Sn caused the interorbital interaction and formed new bonding and antibonding bands. According to the molecular orbital theory, the formation of such an electronic structure has an energy disadvantage. The Al-Sn system is known to be a eutectic binary system which is separated into two phases under the eutectic temperature. The energy disadvantage of the valence electrons was considered to be the origin of phase separation in metallic eutectic binary systems through positive free energy of mixing.

収録刊行物

• 岩石鉱物科学

  岩石鉱物科学 33 (4), 163-171, 2004

  一般社団法人　日本鉱物科学会

キーワード

• Ultraviolet photoelectron spectroscopy (UPS)
• Valence electron
• Interorbital interaction
• Al-Sn system
• Eutectic system

詳細情報

• CRID: 1390001206525656832
• NII論文ID: 10013170392
• NII書誌ID: AA1146088X
• DOI: 10.2465/gkk.33.163
• ISSN: 13497979
• ISSN: 1345630X
• NDL書誌ID: 7085145
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I7085145
• 本文言語コード: ja
• データソース種別:
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• 抄録ライセンスフラグ: 使用不可