More Accurate Breakdown Voltage Estimation for the New Step-up Test Method for Various Probability Distribution Models

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著者

    • Hirose Hideo HIROSE Hideo
    • Department of Systems Innovation and Informatics, Faculty of Computer Science and Systems Engineering, Kyushu Institute of Technology

抄録

The step-up method is used to estimate the impulse breakdown voltageswhen the electrical insulation is not usable after it is broken. This paper analyses the reliability of the estimates of the underlying breakdown probability distribution inthe step-up method, when (1) the observed breakdown voltage itself is available and (2)it is not available. The former case has many advantages compared to the latter case such that (1) the confidence intervals of the estimates become smaller and (2) theestimates can be obtained in stable. This paper summarizes the results of the three cases that the underlying probability distribution for the breakdown voltage is assumedto be normal, Weibull, and gumbel types. The optimal test method is simply and clearlydescribed for various distribution models.

収録刊行物

  • 電気学会論文誌. A, 基礎・材料・共通部門誌 = The transactions of the Institute of Electrical Engineers of Japan. A, A publication of Fundamentals and Materials Society

    電気学会論文誌. A, 基礎・材料・共通部門誌 = The transactions of the Institute of Electrical Engineers of Japan. A, A publication of Fundamentals and Materials Society 124(7), 587-592, 2004-07-01

    一般社団法人 電気学会

参考文献:  6件中 1-6件 を表示

被引用文献:  1件中 1-1件 を表示

各種コード

  • NII論文ID(NAID)
    10013267728
  • NII書誌ID(NCID)
    AN10136312
  • 本文言語コード
    ENG
  • 資料種別
    ART
  • ISSN
    03854205
  • NDL 記事登録ID
    7019522
  • NDL 雑誌分類
    ZN31(科学技術--電気工学・電気機械工業)
  • NDL 請求記号
    Z16-793
  • データ提供元
    CJP書誌  CJP引用  NDL  J-STAGE 
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