Electric field distribution around a transverse defect in an epitaxial YBCO thin film

  • KISS T.
    Research Institute of Superconductor Science and Systems, Kyushu University
  • YASUNAGA M.
    Research Institute of Superconductor Science and Systems, Kyushu University
  • TOKUTOMI H.
    Research Institute of Superconductor Science and Systems, Kyushu University
  • INOUE M.
    Dept of Electrical and Electronic Systems Engineering, Kyushu University
  • TAKEO M.
    Dept of Electrical and Electronic Systems Engineering, Kyushu University

Bibliographic Information

Other Title
  • エピタキシャルYBCO膜中の単一欠陥近傍の電界集中 : 低温レーザ顕微鏡によるイメージングと解析解との定量的比較

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Details 詳細情報について

  • CRID
    1570009750153370368
  • NII Article ID
    10013400862
  • NII Book ID
    AA1195143X
  • ISSN
    09195998
  • Text Lang
    ja
  • Data Source
    • CiNii Articles

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