Thermal Isues in Semiconductor Electronic Devices : Device Level Thermo-Electronic Modeling
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- FUSHINOBU Kazuyoshi
- Department of Mechanical and Control Engineering, Tokyo Institute of Technology
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収録刊行物
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- Thermal science and engineering
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Thermal science and engineering 12 (4), 111-112, 2004-07-01
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詳細情報 詳細情報について
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- CRID
- 1571698600033060864
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- NII論文ID
- 10013430368
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- NII書誌ID
- AA11358679
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- ISSN
- 09189963
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- 本文言語コード
- en
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- データソース種別
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- CiNii Articles