2波長蛍光 Dip 分光法を用いたファーフィールド超解像顕微鏡の2点分解能評価 Two-Point-Separation in Far-Field Super-Resolution Fluorescence Microscopy Based on Two-Color Fluorescence Dip Spectroscopy

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The two-point-resolution of a novel two-color far-field super-resolution fluorescence microscopy has been evaluated. This microscopy is based on a combination of two-color fluorescence dip spectroscopy and a phase modulation technique for the laser beam. The two-point-resolution of the microscopy has been evaluated by using the fluorescent beads of which the size is specified by the observation with AFM. By introducing two color lasers, the observed fluorescence image shrunk down beyond the diffraction limit. In the observation of neighboring two fluorescence beads, pronounced separation between two individual fluorescence spots has been investigated. By taking the focal depth into consideration, FWHM and profile of the fluorescence images were well reproduced. It is proved that our technique breaks the diffraction limit and the spatial resolution of the optical fluorescence microscope can be improved by 2 times higher than the diffraction limit.

収録刊行物

  • 表面科学 = Journal of The Surface Science Society of Japan

    表面科学 = Journal of The Surface Science Society of Japan 25(8), 466-472, 2004-08-10

    公益社団法人 日本表面科学会

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各種コード

  • NII論文ID(NAID)
    10013444717
  • NII書誌ID(NCID)
    AN00334149
  • 本文言語コード
    JPN
  • 資料種別
    ART
  • ISSN
    03885321
  • NDL 記事登録ID
    7063010
  • NDL 雑誌分類
    ZM35(科学技術--物理学)
  • NDL 請求記号
    Z15-379
  • データ提供元
    CJP書誌  NDL  J-STAGE 
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