Ion-Induced Secondary Electron Emission Coefficient ($\gamma$) from MgO Protective Layer with Microscopic Surface Structures in Alternating Current Plasma Display Panels

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著者

    • Oh Jun Seok Oh Jun Seok
    • Charged Particle Beam and Plasma Laboratory/PDP Research Center, Department of Electrophysics, Kwangwoon University, Seoul 139-701, Korea
    • EunHappChoi Choi Eun Ha
    • Charged Particle Beam and Plasma Laboratory/PDP Research Center, Department of Electrophysics, Kwangwoon University, Seoul 139-701, Korea

抄録

We have investigated the influence of microscopic surface structures of the MgO protective layer on the ion-induced secondary electron emission coefficient in alternating-current plasma display panels (AC-PDPs). The microscopic surface structures of the MgO protective layer have been formed by using a mesh mask with an electron beam evaporation method. The ion-induced secondary electron emission coefficient $\gamma$ of the MgO protective layer with mesh-patterned microscopic surface structures has been measured by the $\gamma$-FIB (focused ion beam) system. It is found that the MgO protective layer with microscopic surface structures has a higher $\gamma$ than those without any surface structures.

収録刊行物

  • Japanese journal of applied physics. Pt. 2, Letters

    Japanese journal of applied physics. Pt. 2, Letters 43(9A/B), L1154-L1155, 2004-09-15

    Japan Society of Applied Physics

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各種コード

  • NII論文ID(NAID)
    10013572703
  • NII書誌ID(NCID)
    AA10650595
  • 本文言語コード
    EN
  • 資料種別
    SHO
  • ISSN
    0021-4922
  • NDL 記事登録ID
    7079436
  • NDL 雑誌分類
    ZM35(科学技術--物理学)
  • NDL 請求記号
    Z54-J337
  • データ提供元
    CJP書誌  NDL  JSAP 
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