Crystal Orientation and Microstructure of CeO2 Thin Films Grown on Biaxially Textured Metallic Substrates

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  • Matsumoto Kaname
    Department of Materials Science and Engineering, Kyoto University CREST, Japan Science and Technology Agency
  • Shii Hideyuki
    Department of Materials Science and Engineering, Kyoto University CREST, Japan Science and Technology Agency
  • Ichinose Ataru
    Electric Power Engineering Research Laboratory, Central Research Institute of Electric Power Industry CREST, Japan Science and Technology Agency
  • Adachi Hiroki
    Department of Materials Science and Engineering, Kyoto University
  • Yoshida Yutaka
    Department of Energy Engineering and Science, Nagoya University CREST, Japan Science and Technology Agency
  • Horii Shigeru
    Department of Superconductivity, University of Tokyo CREST, Japan Science and Technology Agency
  • Mukaida Masashi
    Department of Electrical and Information Engineering, Yamagata University CREST, Japan Science and Technology Agency
  • Osamura Kozo
    Department of Materials Science and Engineering, Kyoto University

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Other Title
  • ２軸配向金属基板上に成膜したＣｅＯ２薄膜の結晶配向と微細組織
  • 2ジクハイコウ キンゾク キバン ジョウ ニ セイマク シタ CeO2 ハクマク ノ ケッショウハイコウ ト ビサイ ソシキ

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Abstract

We have fabricated biaxially textured Ni and Ni-0.1 mass%Cr (Ni-Cr) tapes, and crystal orientation and microstructure of CeO2 films deposited on the tapes by pulsed laser deposition were investigated. Recrystallized Ni-Cr tapes had a strong cube texture, {100}‹001› orientation, and the surface of the tapes was occupied by the (100) oriented grains. CeO2 films grown on the Ni-Cr surface showed both the (100) preferred orientation and the strong in-plane alignment. Although recrystallized Ni tapes exhibited the {100}‹001› texture and the CeO2 films subsequently deposited on the tapes also have (100) orientation, a large number of (111) oriented grains were included in the films. The difference between the films deposited on the Ni-Cr and the pure Ni tapes depended on the degree of the cube texture and the surface flatness of the tapes. The preferred orientation of CeO2 films was also affected by the oxygen partial pressure during pulsed laser deposition, and the strong (100) orientation was attained under the pressure of 2.7×10-3 Pa. Moreover, the degree of the (100) orientation of CeO2 films was improved with increase of the film thickness. The microstructure of the films and its texture evolution mechanism were discussed.

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