Thermoelectric Properties, Defect Structure, and Electronic Structure of Ln_0.9Sr_0.1FeO₃₋<i>_δ</i> (Ln = La and Nd)

• KOBAYASHI Kiyoshi

  Laboratory for Membrane Chemistry, ALST Tohoku, National Institute of Advanced Industrial Science and Technology

• YAMAGUCHI Shu

  Department of Material Science and Engineering, School of Engineering, The University of Tokyo

• HIGUCHI Toru

  Facility of Science, Science University of Tokyo

• SHIN Shik

  Institute of Solid State Physics, The University of Tokyo

• TSUKAMOTO Takeyo

  Facility of Science, Science University of Tokyo

• TSUNODA Tatsuo

  Advanced Manufacturing Research Institute, National Institute of Advanced Industrial Science and Technology

Bibliographic Information

Other Title

• Thermoelectric Properties, Defect Structure, and Electronic Structure of Ln0.9Sr0.1FeO3-δ (Ln=La and Nd)
• Thermoelectric Properties Defect Structure and Electronic Structure of Ln0 9Sr0 1FeO3 デルタ Ln La and Nd

Abstract

The electrical conductivity, thermoelectric power, and thermal conductivity of Ln_0.9Sr_0.1FeO_3−δ (Ln = La and Nd) were measured as functions of temperature and oxygen partial pressure, and the electrical transport parameters were calculated using the defect model. It was found that the values of hole mobility, the equilibrium constant of the annihilation reaction for the oxide ion vacancy, thermal conductivity of La_0.9Sr_0.1FeO_3−δ are larger than the values of Nd_0.9Sr_0.1FeO_3−δ, while the thermoelectric power of La_0.9Sr_0.1FeO_3−δ is smaller than those of Nd_0.9Sr_0.1FeO_3−δ at the same hole concentration and temperature. Based on the X-ray absorption spectroscopy measurements, it is suggested that the thermoelectric properties of La_0.9Sr_0.1FeO_3−δ and Nd_0.9Sr_0.1FeO_3−δ are affected by the covalency of iron ions.

Journal

• Electrochemistry

  Electrochemistry 72 (12), 870-875, 2004-12-05

  The Electrochemical Society of Japan

Keywords

• LaFeO₃
• NdFeO₃
• Electrical Conductivity
• Thermoelectric Power
• Thermal Conductivity
• Defect Model

Details

• CRID: 1390564238097859968
• NII Article ID: 10013632096
• NII Book ID: AN00151637
• DOI: 10.5796/electrochemistry.72.870
• ISSN: 21862451
• ISSN: 13443542
• NDL BIB ID: 7173441
• Web Site: http://id.ndl.go.jp/bib/7173441
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I7173441
• Web Site: https://www.jstage.jst.go.jp/article/electrochemistry/72/12/72_870/_pdf
• Text Lang: en
• Data Source:
  • JaLC
  • NDL
  • Crossref
  • CiNii Articles
• Abstract License Flag: Allowed