High-resolution Z-contrast Imaging by the HAADF-STEM Method

• SAITOH Koh

  Ecotopia Science Institute, Nagoya University

Bibliographic Information

Other Title

• 電子線で今何ができるか１．電子線結晶構造解析の最先端　　ＨＡＡＤＦ‐ＳＴＥＭ法による高分解能Ｚコントラスト像観察
• HAADF STEMホウ ニ ヨル コウ ブンカイノウ Zコントラストゾウ カンサツ

Abstract

Characteristic features of the high-angle annular dark-field scanning transmission electron microscope method are described from an experimental viewpoint. Examples of experimental HAADF-STEM images are shown.

Journal

• Nihon Kessho Gakkaishi

  Nihon Kessho Gakkaishi 47 (1), 9-14, 2005

  The Crystallographic Society of Japan

Details

• CRID: 1390001204087175680
• NII Article ID: 10014463309
• NII Book ID: AN00188364
• DOI: 10.5940/jcrsj.47.9
• ISSN: 18845576
• ISSN: 03694585
• NDL BIB ID: 7266190
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I7266190
• Web Site: https://search.jamas.or.jp/link/ui/2005228298
• Text Lang: ja
• Data Source:
  • JaLC
  • NDL
  • Crossref
  • CiNii Articles
• Abstract License Flag: Disallowed