Mechanical Properties of Sharpened Carbon Nanotube Tips

• Akita Seiji

  Department of Physics and Electronics, Osaka Prefecture University

• Ohashi Masakaki

  Department of Physics and Electronics, Osaka Prefecture University

• Nakayama Yoshikazu

  Department of Physics and Electronics, Osaka Prefecture University Handai Frontier Research Center, Graduate School of Engineering, Osaka University

抄録

We investigate the mechanical properties of sharpened nanotube tips for use in scanning probe microscopy in terms of tip bending under a force acting on the side of the tip. The sharpened nanotube probe fabricated by means of a modified electrical breakdown process effectively acts as a probe with high lateral resolution not only in the topographic measurement but also in the potential distribution measurement. Based on molecular mechanics calculations for a sharpened triple-walled nanotube probe, although the interlayer van-der-Waals interaction weakens the probe stiffness expected on the basis of the continuum model, the stiffness of the tapered nanotube is confirmed to be 10 times higher than that for a single-walled nanotube with the same tip radius and the same length.

収録刊行物

• Japanese Journal of Applied Physics

  Japanese Journal of Applied Physics 44 (4A), 1637-1640, 2005

  The Japan Society of Applied Physics

キーワード

• carbon nanotube
• nano-mechanics
• electrical breakdown process
• scanning probe microscope tip
• stiffness
• bending modulus

詳細情報

• CRID: 1390282681241011072
• NII論文ID: 10015469857
• NII論文ID: 210000057554
• NII論文ID: 130004533577
• NII書誌ID: AA10457675
• DOI: 10.1143/jjap.44.1637
• ISSN: 13474065
• ISSN: 00214922
• NDL書誌ID: 7302318
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I7302318
• Web Site: https://iopscience.iop.org/article/10.1143/JJAP.44.1637
• Web Site: https://iopscience.iop.org/article/10.1143/JJAP.44.1637/pdf
• 本文言語コード: en
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