Characterization of DLC films by EELS and electron holography
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- SHINDO Daisuke
- Institute of Multidisciplinary Research for Advanced Materials, Tohoku University
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- MUSASHI Takayuki
- Institute of Multidisciplinary Research for Advanced Materials, Tohoku University
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- IKEMATSU Yoichi
- Institute of Multidisciplinary Research for Advanced Materials, Tohoku University
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- MURAKAMI Yasukazu
- Institute of Multidisciplinary Research for Advanced Materials, Tohoku University
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- NAKAMURA Norikazu
- Fujitsu Laboratories Ltd
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- CHIBA Hiroshi
- Fujitsu Laboratories Ltd
Search this article
Journal
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- Journal of electron microscopy
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Journal of electron microscopy 54 (1), 11-17, 2005-01-01
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Keywords
Details 詳細情報について
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- CRID
- 1572824500029897856
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- NII Article ID
- 10015519829
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- NII Book ID
- AA00697060
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- ISSN
- 00220744
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- Text Lang
- en
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- Data Source
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- CiNii Articles