Diagnosis of Timing Faults in Scan Chains Using Single Excitation Patterns(VLSI Design Technology and CAD)

Search this Article

Author(s)

Abstract

A diagnosis technique is presented to locate at least one fault in a scan chain with multiple timing faults. This diagnosis technique applies Single Excitation (SE) patterns of which only one bit can be flipped even in the presence of multiple faults. By applying the SE patterns, the problem of simulations with unknown values is eliminated. The diagnosis result is therefore deterministic, not probabilistic. Experiments on the IS-CAS benchmark circuits show that the average diagnosis resolution is less than ten scan cells.

Journal

  • IEICE transactions on fundamentals of electronics, communications and computer sciences

    IEICE transactions on fundamentals of electronics, communications and computer sciences E88-A(4), 1024-1030, 2005-04-01

    The Institute of Electronics, Information and Communication Engineers

References:  11

Codes

  • NII Article ID (NAID)
    10016562745
  • NII NACSIS-CAT ID (NCID)
    AA10826239
  • Text Lang
    ENG
  • Article Type
    ART
  • ISSN
    09168508
  • Data Source
    CJP  NII-ELS 
Page Top