Prototype of Atomic Force Cantilevered SNOM Based on Through-The-Lens-Type Optical Lever and Polarized Illumination and Detection System
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- Ono Masayuki
- Department of Nano-Material Systems, Gunma University
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- Sone Hayato
- Department of Nano-Material Systems, Gunma University
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- Hosaka Sumio
- Department of Nano-Material Systems, Gunma University
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Atomic force cantilevered scanning near-field optical microscopy (ANOM) has been proposed for observing a micromagnetic structure of a recorded magneto-optical (MO) disc. The prototype system has an ability to obtain both atomic force microscopy (AFM) and scanning near-field microscopy (SNOM) images simultaneously. This system has some special functions: (1) it keeps the sample-probe gap constant with atomic force and an AFM cantilever, (2) it generates near-field light from the small aperture formed on the tip of the cantilever, (3) it uses a polarized light in the laser beam illumination and detection systems, and (4) it adjusts laser beams incident on fixed positions of the cantilever in ANOM optics. As an experimental result, we obtained SNOM and contact mode AFM images of a commercial MO disc. We can detect a polarized plane at a minimum angle of less than 0.2 deg. and observe submicron recorded magnetic domains on a 640 MB MO disc.
収録刊行物
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- Japanese Journal of Applied Physics
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Japanese Journal of Applied Physics 44 (7B), 5434-5437, 2005
The Japan Society of Applied Physics
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詳細情報 詳細情報について
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- CRID
- 1390282681242450048
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- NII論文ID
- 210000058461
- 10016677066
- 130004534480
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- NII書誌ID
- AA10457675
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- ISSN
- 13474065
- 00214922
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- NDL書誌ID
- 7378468
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- NDL
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