Analysis of Defects Formation and Mobility during Ion Irradiation by Coherent Precipitates

• Li Zheng-cao

  Department of Quantum Engineering and Systems Science, School of Engineering, University of Tokyo

• Abe Hiroaki

  Nuclear Professional School, School of Engineering, University of Tokyo

• Sekimura Naoto

  Department of Quantum Engineering and Systems Science, School of Engineering, University of Tokyo

抄録

Transmission electron microscopy observation of cross-sectional specimens prepared by focused ion beam milling method have been applied to study the deep radiation damage and depth profile of point defects generated during ion irradiation in Cu–1 mass%Co alloy specimens by means of coherent precipitates. The specimens were irradiated at a temperature range of 250 to 500°C by 4 and 0.6 MeV self Cu ions to a dose of 0.3 dpa. The damage range has been observed at depths well beyond that expected from ion damage range calculations.

収録刊行物

• MATERIALS TRANSACTIONS

  MATERIALS TRANSACTIONS 47 (2), 259-262, 2006

  公益社団法人 日本金属学会

キーワード

• ion irradiation
• point defect
• depth profile

詳細情報

• CRID: 1390001204251627136
• NII論文ID: 10017282810
• NII書誌ID: AA1151294X
• DOI: 10.2320/matertrans.47.259
• ISSN: 13475320
• ISSN: 13459678
• NDL書誌ID: 7830393
• Web Site: http://id.ndl.go.jp/bib/7830393
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I7830393
• Web Site: https://www.jstage.jst.go.jp/article/matertrans/47/2/47_2_259/_pdf
• 本文言語コード: en
• データソース種別:
  • JaLC
  • NDL
  • Crossref
  • CiNii Articles
• 抄録ライセンスフラグ: 使用不可