Cross-sectional image obtained from spherical aberration-free three-dimensional image intensity distribution in transmission electron microscopy

• TAYA Masaki

  Department of Material and Life Science, Graduate School of Engineering, Osaka University

• KAWASAKI Tadahiro

  Department of Material and Life Science, Graduate School of Engineering, Osaka University

• TAKAI Yoshizo

  Department of Material and Life Science, Graduate School of Engineering, Osaka University

Journal

• Journal of electron microscopy

  Journal of electron microscopy 55 (1), 27-30, 2006-01-01

Keywords

• Cross-sectional image
• transmission electron microscopy
• three-dimensional image intensity distribution
• three-dimensional Fourier filtering method
• spherical aberration correction
• dynamical electron scattering effect

Details

• CRID: 1570009750431966848
• NII Article ID: 10018006205
• NII Book ID: AA00697060
• ISSN: 00220744
• Text Lang: en
• Data Source:
  • CiNii Articles