Wavelet-Based Image Enhancement for Defect Detection in Thin Film Transistor Liquid Crystal Display Panel
This paper proposes a wavelet-based prepossessing method to improve the detecting capacity of a blob-Mura-defect-detecting algorithm. The non-uniformity of the background region is eliminated by replacing the approximation coefficients with a constant value, and the brightness difference between the background region and defect regions is increased by multiplying the detail coefficients and a weighting factor. The proposed method can perfectly control the detectable defect level by properly selecting the defect detecting level. Experimental results demonstrate that the proposed method can effectively enhance blob-Mura defects in thin film transistor liquid crystal display panels.
- Japanese journal of applied physics. Pt. 1, Regular papers & short notes
Japanese journal of applied physics. Pt. 1, Regular papers & short notes 45(6A), 5069-5072, 2006-06-15
Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physics