High Sensitive Imaging of Atomic Arrangement of Ge Clusters Buried in a Si Crystal by X-ray Fluorescence Holography

• Shuji Kusano

• Shinichiro Nakatani

• Kazushi Sumitani

Bibliographic Information

Other Title

• High Sensitive Imaging of Atomic Arrangement of Ge Clusters Buried in a Si Crystal by X ray Fluorescence Holography

Abstract

コレクション : 国立国会図書館デジタルコレクション > デジタル化資料 > 雑誌

Journal

• Japanese journal of applied physics. Part. 1, Regular papers, brief communications & review papers : JJAP

  Japanese journal of applied physics. Part. 1, Regular papers, brief communications & review papers : JJAP 45 (6A), 5248-5253, 2006-06

  Tokyo : Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physics

Keywords

• internal detector scheme
• internal source scheme
• local structure
• Ge cluster
• thin Si/Ge multilayer

Details

• CRID: 1520572357109730560
• NII Article ID: 10018149383
• NII Book ID: AA10457675
• ISSN: 00214922
• ISSN: 13474065
• DOI: 10.1143/jjap.45.5248
• NDL BIB ID: 7941559
• Web Site: http://id.ndl.go.jp/bib/7941559
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I7941559
• Web Site: https://iopscience.iop.org/article/10.1143/JJAP.45.5248
• Web Site: https://iopscience.iop.org/article/10.1143/JJAP.45.5248/pdf
• Text Lang: en
• NDL Source Classification:
  • ZM35(科学技術--物理学)
• Data Source:
  • NDL
  • Crossref
  • CiNii Articles