EELS Analysis of a Low Concentration Dopant in a Lithium-Ion Secondary Battery Material by Anisotropic PIXON Method

• Muto Shunsuke

  Graduate School of Engineering, Nagoya University

• Tatsumi Kazuyoshi

  Graduate School of Engineering, Nagoya University

• Sasano Yusuke

  Graduate School of Engineering, Nagoya University

• Yoshida Tomoko

  Graduate School of Engineering, Nagoya University

• Puetter Richard C.

  PixonImaging LLC

• Sasaki Tsuyoshi

  Toyota Central R & D Labs Inc.

• Ukyo Yoshio

  Toyota Central R & D Labs Inc.

• Takeuchi Yoji

  Toyota Central R & D Labs Inc.

Bibliographic Information

Other Title

• 非等方PIXON法によるリチウムイオン二次電池材料の微量添加元素のEELS分析

Journal

• Materia Japan

  Materia Japan 45 (12), 869-869, 2006

  The Japan Institute of Metals and Materials

Keywords

• energy-loss near edge structure
• Pixon method
• lithium ion secondary battery
• electronic structure
• signal processing

Details

• CRID: 1390001204078552320
• NII Article ID: 10018421938
• NII Book ID: AN10433227
• DOI: 10.2320/materia.45.869
• ISSN: 18845843
• ISSN: 13402625
• Web Site: https://www.jstage.jst.go.jp/article/materia1994/45/12/45_12_869/_pdf
• Data Source:
  • JaLC
  • Crossref
  • CiNii Articles
  • KAKEN