Improved Sensitivity of Optical Frequency Domain Reflectometry-Optical Coherence Tomography Using a Semiconductor Optical Amplifer
Bibliographic Information
- Other Title
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- Improved Sensitivity of Optical Frequency Domain Reflectometry Optical Coherence Tomography Using a Semiconductor Optical Amplifer
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Journal
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- Japanese journal of applied physics. Part 2, Letters & express letters
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Japanese journal of applied physics. Part 2, Letters & express letters 45 (46-50), L1317-1319, 2006-12
Tokyo : Japan Society of Applied Physics
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Details 詳細情報について
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- CRID
- 1524232505015270272
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- NII Article ID
- 10018461242
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- NII Book ID
- AA11906093
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- ISSN
- 00214922
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- NDL BIB ID
- 8590268
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- Text Lang
- en
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- NDL Source Classification
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- ZM35(科学技術--物理学)
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- Data Source
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- NDL
- CiNii Articles