Non-linear Distortion Caused by the Electrical Memory Effect and its Dependence on the Circuit Parameters of a GaAs MESFET Amplifier
-
- TAKANO Takeshi
- Fujitsu Laboratories YRP R&D Center
-
- MANIWA Toru
- Fujitsu Laboratories YRP R&D Center
-
- OISHI Yasuyuki
- Fujitsu Laboratories YRP R&D Center
-
- ARAKI Kiyomichi
- Tokyo Institute of Technology
-
- DAIDO Yoshimasa
- Kanazawa Institute of Technology
Search this article
Journal
-
- 電気学会研究会資料. EDD, 電子デバイス研究会
-
電気学会研究会資料. EDD, 電子デバイス研究会 2003 (79), 47-53, 2003-11-18
- Tweet
Details 詳細情報について
-
- CRID
- 1573668925182682240
-
- NII Article ID
- 10018989560
-
- NII Book ID
- AN1044178X
-
- Text Lang
- en
-
- Data Source
-
- CiNii Articles