Minor and trace element analysis of natural zircon (ZiSiO_4) by SIMS and laser ablation ICPMS : A consideration and comparison of two broadly competitive techniques

• HOSKIN P. W. O.

Journal

• Jour. Trace Micropr. Tech.

  Jour. Trace Micropr. Tech. 16 301-326, 1998

Details

• CRID: 1574231875238988672
• NII Article ID: 10019870285
• Data Source:
  • CiNii Articles