Influence of high-pressure torsion straining conditions on microstructure evolution in commercial aluminum
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- Todaka Yoshikazu
- Department of Production Systems Engineering, Toyohashi University of Technology
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- Umemoto Minoru
- Department of Production Systems Engineering, Toyohashi University of Technology
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- Yamazaki Ayumi
- Department of Production Systems Engineering, Toyohashi University of Technology
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- Sasaki Jun
- Department of Production Systems Engineering, Toyohashi University of Technology
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- Tsuchiya Koichi
- Department of Production Systems Engineering, Toyohashi University of Technology
書誌事項
- タイトル別名
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- Influence of High-Pressure Torsion Straining Conditions on Microstructure Evolution in Commercial Purity Aluminum
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The influence of heat generation during severe plastic deformation on microstructure evolution was investigated in commercial purity aluminum (Al 1050, CP-Al) by using high-pressure torsion (HPT) process. The microstructure was characterized by the observations of the torsion and the longitudinal planes. CP-Al disks were deformed by HPT-straining up to 20 turns (equivalent strain, εeq, of ∼600) at 0.2 or 5 rpm at room temperature. To prevent the increase in specimen temperature, HPT-straining was also carried out in liquid nitrogen. In the all conditions, the value of Vicker’s microhardness, Hv, was saturated around 0.65 GPa and the microstructure consisted of the equiaxed grains of about 500 nm with quite low dislocation density. The microstructure in the early stage of HPT-straining showed the deformed (sub)structure, and then the equiaxed grain structure with high-angle boundaries formed by grain subdivision, recovery, continuous recrystallization and grain growth with increase in strain amounts and specimen temperature.
収録刊行物
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- MATERIALS TRANSACTIONS
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MATERIALS TRANSACTIONS 49 (1), 7-14, 2008
公益社団法人 日本金属学会
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詳細情報 詳細情報について
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- CRID
- 1390001204249171456
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- NII論文ID
- 10020088312
- 130004453772
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- NII書誌ID
- AA1151294X
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- ISSN
- 13475320
- 13459678
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- NDL書誌ID
- 9319483
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可