Application of FIB system to ultra-high-pressure Earth science

Access this Article

Search this Article

Author(s)

    • MIYAHARA Masaaki
    • Institute of Mineralogy, Petrology and Economic Geology, Graduate School of Science, Tohoku University
    • SAKAI Takeshi
    • Institute of Mineralogy, Petrology and Economic Geology, Graduate School of Science, Tohoku University
    • OHTANI Eiji
    • Institute of Mineralogy, Petrology and Economic Geology, Graduate School of Science, Tohoku University
    • KOBAYASHI Yusuke
    • Institute of Mineralogy, Petrology and Economic Geology, Graduate School of Science, Tohoku University
    • KAMADA Seiji
    • Institute of Mineralogy, Petrology and Economic Geology, Graduate School of Science, Tohoku University
    • YOO Jung Ho
    • Measurement & Analysis Team, National NanoFab center

Abstract

The conventional focused ion beam (FIB) sample preparation technique “lift-out method” was modified for the reliable analysis of a laser-heated diamond anvil cell (LHDAC) sample. Box-shaped grooves were prepared in the LHDAC specimen in order to recover a block using a gallium ion beam in the vicinity of the area to be characterized by transmission electron microscope (TEM). The recovered block was fixed on the stage of a copper (or molybdenum) grid and thinned by the gallium ion beam in order to obtain a TEM foil. Our modified lift-out method allows us to thin the entire vertical section </i>(from the upper anvil surface to the lower anvil surface) of the LHDAC sample.

Journal

  • Journal of Mineralogical and Petrological Sciences

    Journal of Mineralogical and Petrological Sciences 103(2), 88-93, 2008-04-01

    Japan Association of Mineralogical Sciences

References:  20

Codes

  • NII Article ID (NAID)
    10020736990
  • NII NACSIS-CAT ID (NCID)
    AA11460926
  • Text Lang
    ENG
  • Article Type
    ART
  • ISSN
    13456296
  • Data Source
    CJP  J-STAGE 
Page Top