Application of FIB system to ultra-high-pressure Earth science

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著者

    • MIYAHARA Masaaki
    • Institute of Mineralogy, Petrology and Economic Geology, Graduate School of Science, Tohoku University
    • SAKAI Takeshi
    • Institute of Mineralogy, Petrology and Economic Geology, Graduate School of Science, Tohoku University
    • OHTANI Eiji
    • Institute of Mineralogy, Petrology and Economic Geology, Graduate School of Science, Tohoku University
    • KOBAYASHI Yusuke
    • Institute of Mineralogy, Petrology and Economic Geology, Graduate School of Science, Tohoku University
    • KAMADA Seiji
    • Institute of Mineralogy, Petrology and Economic Geology, Graduate School of Science, Tohoku University
    • YOO Jung Ho
    • Measurement & Analysis Team, National NanoFab center

抄録

The conventional focused ion beam (FIB) sample preparation technique “lift-out method” was modified for the reliable analysis of a laser-heated diamond anvil cell (LHDAC) sample. Box-shaped grooves were prepared in the LHDAC specimen in order to recover a block using a gallium ion beam in the vicinity of the area to be characterized by transmission electron microscope (TEM). The recovered block was fixed on the stage of a copper (or molybdenum) grid and thinned by the gallium ion beam in order to obtain a TEM foil. Our modified lift-out method allows us to thin the entire vertical section </i>(from the upper anvil surface to the lower anvil surface) of the LHDAC sample.

収録刊行物

  • Journal of mineralogical and petrological sciences

    Journal of mineralogical and petrological sciences 103(2), 88-93, 2008-04-01

    一般社団法人 日本鉱物科学会

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各種コード

  • NII論文ID(NAID)
    10020736990
  • NII書誌ID(NCID)
    AA11460926
  • 本文言語コード
    ENG
  • 資料種別
    ART
  • ISSN
    13456296
  • データ提供元
    CJP書誌  J-STAGE 
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