Ｘ線分光の現在　　ＩＩＩ．蛍光Ｘ線ホログラフィー

• 林 好一

  東北大学金属材料研究所

書誌事項

タイトル別名

• Modern X-ray Spectroscopy III. X-ray Fluorescence Holography
• Xセン ブンコウ ノ ゲンザイ 3 ケイコウ Xセン ホログラフィー
• III. X-ray Fluorescence Holography
• III.蛍光X線ホログラフィー

抄録

X-ray fluorescence holography (XFH) provides three dimensional atomic images around specified elements. The XFH uses atoms as a wave source or monitor of interference field within a crystal sample, and therefore it can record both intensity and phase of scattered X-rays. Its current performance makes it possible to apply to ultra thin film, impurity and quasicrystal. In this article, I show the theory including solutions for twin image problem, advanced measuring system, data processing for reconstruction of the atomic images and for obtaining accurate atomic positions, applications using resonant X-ray scattering and X-ray excited optical luminescence, and an example of XFH result on the local structure around copper in silicon steal.

収録刊行物

• 分光研究

  分光研究 57 (3), 124-135, 2008

  社団法人 日本分光学会

キーワード

• X-ray fluorescence holography
• X-ray holography
• X-ray scattering
• single crystal
• impurity

詳細情報

• CRID: 1390282681236606336
• NII論文ID: 10020861749
• NII書誌ID: AN00222531
• DOI: 10.5111/bunkou.57.124
• ISSN: 18846785
• ISSN: 00387002
• NDL書誌ID: 9553202
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I9553202
• 本文言語コード: ja
• データソース種別:
  • JaLC
  • NDL
  • Crossref
  • CiNii Articles
• 抄録ライセンスフラグ: 使用不可