Etching Behavior of Poly(vinylidene fluoride) Thin Films Irradiated with Ion Beams-Effect of Irradiated Ions and Pretreatment
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- YAMAKI Tetsuya
- Quantum Beam Science Directorate, Japan Atomic Energy Agency
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- ROHANI Rosiah
- Quantum Beam Science Directorate, Japan Atomic Energy Agency
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- KOSHIKAWA Hiroshi
- Quantum Beam Science Directorate, Japan Atomic Energy Agency
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- TAKAHASHI Shuichi
- Quantum Beam Science Directorate, Japan Atomic Energy Agency
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- HASEGAWA Shin
- Quantum Beam Science Directorate, Japan Atomic Energy Agency
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- ASANO Masaharu
- Quantum Beam Science Directorate, Japan Atomic Energy Agency
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- VOSS Kay-Obbe
- Materials Research Department, Gesellschaft für Schwerionenforschung mbH (GSI)
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- NEUMANN Reinhard
- Materials Research Department, Gesellschaft für Schwerionenforschung mbH (GSI)
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- MAEKAWA Yasunari
- Quantum Beam Science Directorate, Japan Atomic Energy Agency
Bibliographic Information
- Other Title
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- イオンビーム照射ポリフッ化ビニリデン薄膜のエッチング挙動 エッチング前処理・照射イオン効果の検討
- イオン ビーム ショウシャ ポリフッカ ビニリデン ハクマク ノ エッチング キョドウ エッチング マエショリ ショウシャ イオン コウカ ノ ケントウ
- Etching Behavior of Poly(vinylidene fluoride) Thin Films Irradiated with Ion Beams—Effect of Irradiated Ions and Pretreatment
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Abstract
Poly(vinylidene fluoride) thin films irradiated with four kinds of ion beams were exposed to a 9 M KOH aqueous solution after their storage in air for 30 or 90 days at different temperatures. According to the conductometry, the heating at 120°C was found to enhance the etch rate in the latent track without changing that in the bulk, thereby enabling us to obtain very high etching sensitivity for the preparation of nano-sized through-pores. The formation of hydroperoxides during this pretreatment should facilitate the introduction of the etching agent to improve etchability. Additionally, the irradiation of higher-LET ions, causing each track to contain more activated sites (like radicals), was preferable to achieve high sensitivity of the etching.<br>
Journal
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- KOBUNSHI RONBUNSHU
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KOBUNSHI RONBUNSHU 65 (3), 273-276, 2008
The Society of Polymer Science, Japan
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Details 詳細情報について
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- CRID
- 1390001206521612800
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- NII Article ID
- 130004489166
- 10021120290
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- NII Book ID
- AN00085011
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- COI
- 1:CAS:528:DC%2BD1cXmtVymsrc%3D
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- ISSN
- 18815685
- 03862186
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- NDL BIB ID
- 9437736
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed