New Simple Photoemission Electron Microscope with an Energy Filter

• TÓTH László

  Nara Institute of Science and Technology (NAIST) Japan Science and Technology Agency

• MATSUDA Hiroyuki

  Nara Institute of Science and Technology (NAIST) Japan Science and Technology Agency

• SHIMIZU Tatsuya

  Nara Institute of Science and Technology (NAIST)

• MATSUI Fumihiko

  Nara Institute of Science and Technology (NAIST) Japan Science and Technology Agency

• DAIMON Hiroshi

  Nara Institute of Science and Technology (NAIST) Japan Science and Technology Agency

抄録

  We have developed a new Wide Acceptance Angle Electrostatic Lens (WAAEL) and applied that as display-type electron energy analyser. Our present lens achieves ±60° (1π sr) acceptance angle and has a good focusing capability with 5-times magnifications. The relative energy resolution is typically from 2 to 5×10^-3 and depends on the emission area on the sample, as well as, on the diameter of exit aperture. Some preliminary results and discussions related to its energy resolution are shown.<br>

収録刊行物

• Ｊｏｕｒｎａｌ　ｏｆ　ｔｈｅ　Ｖａｃｕｕｍ　Ｓｏｃｉｅｔｙ　ｏｆ　Ｊａｐａｎ

  Ｊｏｕｒｎａｌ　ｏｆ　ｔｈｅ　Ｖａｃｕｕｍ　Ｓｏｃｉｅｔｙ　ｏｆ　Ｊａｐａｎ 51 (3), 135-137, 2008

  一般社団法人 日本真空学会

キーワード

• Spectroscopy
• Surfaces and Interfaces
• Instrumentation
• General Materials Science

詳細情報

• CRID: 1390282680272157568
• NII論文ID: 10021156890
• NII書誌ID: AA12298652
• DOI: 10.3131/jvsj2.51.135
• ISSN: 18824749
• ISSN: 18822398
• NDL書誌ID: 9471368
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I9471368
• 本文言語コード: en
• データソース種別:
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