Site-Specific Specimen Preparation by Focused Ion Beam Milling for Transmission Electron Microscopy of Metal Matrix Composites
収録刊行物
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- Diamond and Related Mater.
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Diamond and Related Mater. 13 393-400, 2004
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詳細情報
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- CRID
- 1572824500455179904
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- NII論文ID
- 10021172655
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- データソース種別
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- CiNii Articles