Impact of 1-2nm Gate Oxide for Sub-Quarter Micron Dual Gate CMOS

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Author(s)

Journal

  • Extended abstracts of the ... Conference on Solid State Devices and Materials

    Extended abstracts of the ... Conference on Solid State Devices and Materials 1999, 114-115, 1999-09-20

References:  4

  • <no title>

    TIMP G.

    IEDM Tech. Dig., 1998, 1998

    Cited by (1)

  • <no title>

    KIMIZUKA N.

    VLSI Tech. Dig., 1998, 1998

    Cited by (1)

  • <no title>

    KUROI T.

    VLSI Tech. Dig., 1996, 1996

    Cited by (1)

  • <no title>

    KOH M.

    IEDM Tech. Dig., 1998, 1998

    Cited by (1)

Codes

  • NII Article ID (NAID)
    10022536131
  • NII NACSIS-CAT ID (NCID)
    AA10777858
  • Text Lang
    ENG
  • Article Type
    SHO
  • Data Source
    CJP 
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