Suppression of Stand-by Tunnel Current in Ultra-Thin Gate Oxide MOSFETs by Dual Oxide Thickness MTCMOS(DOT-MTCMOS)

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Author(s)

Journal

  • Ext. Abst. of SSDM

    Ext. Abst. of SSDM 1999, 264-265, 1999-09-20

References:  7

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    IEDM, 1997, 1997

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    Jpn. J. Appl. Phys. 34, L903, 1995

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    MUHTOH S.

    IEEE J. Solid-State Circuits 30(8), 847-854, 1995

    DOI  Cited by (146)

Cited by:  2

Codes

  • NII Article ID (NAID)
    10022536599
  • NII NACSIS-CAT ID (NCID)
    AA10777858
  • Text Lang
    ENG
  • Article Type
    Proceedings
  • Data Source
    CJP  CJPref 
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