Connection Test of Area Bump Using Active-Matrix Switches
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- WATANABE Naoya
- Center for Microelectronic Systems, Kyushu Institute of Technology
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- HASEGAWA Satoshi
- Center for Microelectronic Systems, Kyushu Institute of Technology
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- ASANO Tanemasa
- Center for Microelectronic Systems, Kyushu Institute of Technology
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- Extended abstracts of the ... Conference on Solid State Devices and Materials
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Extended abstracts of the ... Conference on Solid State Devices and Materials 2004 280-281, 2004-09-15
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詳細情報 詳細情報について
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- CRID
- 1573668925402489728
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- NII論文ID
- 10022538485
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- NII書誌ID
- AA10777858
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- 本文言語コード
- en
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- データソース種別
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- CiNii Articles