Surface Hall Potentiometry to Characterize Functional Semiconductor Films
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- ARIMA Kenta
- Department of Precision Science and Technology, Graduate School of Engineering, Osaka University
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- HIWA Kenji
- Department of Precision Science and Technology, Graduate School of Engineering, Osaka University
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- NAKAOKA Ryoji
- Department of Precision Science and Technology, Graduate School of Engineering, Osaka University
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- MORITA Mizuho
- Department of Precision Science and Technology, Graduate School of Engineering, Osaka University
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- Extended abstracts of the ... Conference on Solid State Devices and Materials
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Extended abstracts of the ... Conference on Solid State Devices and Materials 2005 378-379, 2005-09-13
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詳細情報 詳細情報について
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- CRID
- 1571417125602221056
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- NII論文ID
- 10022541984
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- NII書誌ID
- AA10777858
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- 本文言語コード
- en
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- データソース種別
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- CiNii Articles